Videos 


DAC 2009: Coping with Modern AMS Challenges

The guest panel of industry experts discussed how they are addressing key verification challenges at 32 nanometers, achieving high-accuracy verification for complex BCD and FPGA applications, and using power management techniques for custom DSP designs.
John Chilton, Sr. VP of Marketing & Corporate Development, Synopsys; Aaron Barker, Staff Engineer, Sun Microsystems; Eugene Chen, CAD Director, Alter; Sandeep Tare, Verification Methodology Engineer, Texas Instruments; Lyes Djama, Smart Power Design Flows Manager; Pierluigi Daglio, AMS Design & Verification Flows Manager, STMicroelectronics



DAC 2009: Solutions for Tough Verification Challenges

Synopsys hosted a special VCS Verification Luncheon event at DAC in San Francisco, CA focused on the VCS functional verification solution. Verification R&D experts from leading companies discussed how they leverage VCS’s multicore performance, transaction-based verification, tight mixed-signal integration, comprehensive low power verification capabilities and proven methodologies to solve today’s toughest verification challenges.
John Chilton, Sr. VP of Marketing & Corporate Development, Synopsys; YC Wong, Director of IC Engineering, Broadcom; Shrenik Mehta, Sr. Director of Frontend Tools and OpenSPARC, Sun Microsystems; Faisal Haque, Director of Engineering, Qualcomm; and Amit Chowdhry, Member of Technical Staff, AMD




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