| Oct 28, 2009 | NVIDIA Adopts Synopsys Yield Explorer to Reduce Time to Volume
Design-centric yield management enables product engineers to achieve rapid yield ramp and provide cost-effective yield control in volume production |
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| Mar 16, 2009 | Synopsys Announces Yield Explorer – Design-Centric Yield Management for Product Engineering Teams
Yield Explorer Demonstrates 10x Faster Volume Diagnostics Analysis with a Single Data-Bank for Design, Fab and Test Data to Identify the Source of Yield Loss |
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| Feb 26, 2008 | Synopsys Unveils Proteus Pipeline Technology, Delivering a New Level of Performance
Synopsys Inc. today announced the capability to pipeline key manufacturing applications. The new pipeline technology delivers reduction in design-to-mask cycle time. |
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| Oct 23, 2007 | Synopsys Customers Accelerate Yield Learning With Converged Test and Yield Management Data Flow
Synopsys, Inc. today announced general availability of the Odyssey Design-for-Test (DFT) module for use by design organizations worldwide. |
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| Sep 18, 2007 | Nikon and Synopsys Announce Manufacturing-Aware DFM Solution for 45 nm and Below
Embedded Scanner Parameter Module Delivers Improved OPC Accuracy, Enhanced Model Predictability and Reduced Time to Silicon for Mutual Customers |
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| Sep 11, 2007 | Voltaire and Synopsys Introduce High-Performance Compute Solution to Reduce Cycle Time for Semiconductor Mask Manufacturing
Voltaire Ltd. today announced they are developing a high-performance compute (HPC) cluster solution for semiconductor mask data-preparation (MDP) applications. |
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| Jun 12, 2007 | Synopsys and Hitachi High-Technologies Deliver Enhanced OPC Modeling Speed, Accuracy and Predictability
Synopsys, Inc. today announced that they have developed a seamless link between Hitachi High-Tech's DesignGauge design data measuring system and Synopsys' Proteus optical proximity correction (OPC) solution. |
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| Feb 27, 2007 | Synopsys Proteus OPC Delivers Superior Cost of Ownership on Intel® Core™ Microarchitecture
Optimized x86-64 Hardware Offers Superior Price/Performance for OPC Compared to Custom Hardware Platforms |
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| Jul 24, 2006 | Synopsys Extends DFM Leadership with Launch of PrimeYield Tool Suite for Yield Analysis
Integration of Production-Proven Design and Manufacturing Technology Accelerates Time to Yield |
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| Jul 24, 2006 | Synopsys PrimeYield LCC Links to IC Compiler for Automated Correction of Lithography Problems
Toshiba to Deploy Integrated, Production-Proven DFM Technology into Standard Layout Flow |
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| Dec 19, 2005 | Synopsys’ PSM Technology Adopted by NEC Electronics for 65-nm Production and Beyond
PSM Technology Enhances Lithography Resolution and Yield for High-Performance Products |
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| Oct 04, 2005 | SEMATECH and Synopsys to Develop Advanced OPC Models for 45-Nanometer
Accurate OPC Modeling Critical for Accelerating Time to Yield |
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| May 24, 2005 | Synopsys i-Virtual Stepper System for Photomask Qualification Implemented by UMC
i-Virtual Stepper System Integrates Lithography Simulation and Automation to Deliver Improved Mask Turn-Around Time and Yield. |
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| Mar 01, 2005 | Grace Semiconductor Manufacturing Standardizes on Synopsys' DFM Tool Suite
Synopsys' Distributed Processing and Scalable Architecture Improve Time to Yield While Maintaining Accuracy
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