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Foundry-Fabless Collaboration for Higher Starting Yields and Faster Yield Ramp
Learn about GLOBALFOUNDRIES??? foundry-fabless collaboration model for volume diagnostics that resolves the issue of gaining access to closely guarded design data by eliminating the need for design IP to leave foundry customers.
Thomas Berndt, MTS Product Engineer, Yield Engineering, GLOBALFOUNDRIES Dresden
May 17, 2012 | | | Using TetraMAX Diagnostics and Yield Explorer for Rapid Failure Analysis
Learn how TetraMAX ATPG and Yield Explorer provide a fully automated diagnostics solution for isolation of silicon defects and analysis of systematic yield issues.
John Kirkland, CAE Manager, Synopsys; Girish Patankar, Principal Engineer, Synopsys; Cy Hay, Technical Marketing Manager, Synopsys;
Jun 28, 2011 | | | Lithography Verification on Advanced Nodes with Proteus LRC
Learn about Proteus LRC, Synopsys' next-generation lithography rule check tool, and how it can be used to accelerate your technology ramp.
Kunal Taravade, Sr. Applications Engineering Manager, Synopsys; Travis Brist, Sr. Product Marketing Manager, Synopsys; Tim Tsuei, Corporate Applications Engineering Manager, Synopsys
Jun 03, 2011 | | | Volume Diagnostics for Rapid Yield Ramp at Nanometer Nodes
Learn how Yield Explorer, Synopsys' unique design-centric yield analysis solution, can help you accelerate yield ramp for your next device.
Dr. Thomas W. Williams, Retired Synopsys Fellow and Adjunct Professor, University of Calgary; Sagar A. Kekare, Group Manager, Product Marketing, Manufacturing Yield Management, Synopsys
May 03, 2011 | | |
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