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Accelerating Tool and Methodology Adoption
Take Full Advantage Of The Latest Tool Features And Methodologies
Design Flow Deployment
Optimize Your Design Flow To Address The Latest Design Challenges
Design Implementation Collaboration
Leverage Tapeout-proven Flows And Project Experience To Get Your Chip Done
Low Power Optimization and Verification
Implement Low Power Techniques To Optimize Your Chip’s Power Consumption
Predictable Silicon Sign-Off
Early Optimization For Physical Effects Improves Netlist Handoff
FPGA-Based Prototyping
Enabling Early System and Software Development
SoC Design and Verification
Achieve Rapid Design Closure By Applying Best Design Practices From The Start
Honeywell and Synopsys Enable Next-Generation Rad-Hard ASICs
Through the combination of a specially-targeted silicon-on-insulator (SOI) manufacturing technology and optimized design flow, Honeywell and Synopsys provide the industry's most comprehensive development capability for radiation-hardened (rad-hard) and radiation-tolerant ASICs.
EDN Article
Semi ecosystem collaboration more critical than ever
EETimes Article
As design goes global, tools get more critical
News Releases
Jun
9
Synopsys Delivers Comprehensive Design Enablement for TSMC 28-nm Process Technology with Reference Flow 11.0
Aug
3
Rockchip Collaborates with Synopsys and Chartered to Achieve First-Pass Silicon Success
Oticon Success
We were extremely satisfied with the results achieved...
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News
Synopsys Delivers Comprehensive Design Enablement for TSMC 28-nm Process....
Rockchip Collaborates with Synopsys and Chartered to Achieve First-Pass Silicon....
Synopsys Galaxy Implementation Platform Supports TSMC 28-Nanometer Process....
SMIC and Synopsys Announce Availability of Reference Flow 4.0
Synopsys Announces the Tapeout of NEC Electronics' Latest EMMA System LSI Using....
Synopsys Delivers 45-Nanometer Low Power Reference Flow for Common Platform....
Synopsys and UMC Release 65-Nanometer Low Power Design Flow Enabled by the....
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All Synopsys News
Articles
Semi ecosystem collaboration more critical than ever
As design gloes global, tools get more critical
Complex SoC Testing with a Core-Based DFT Strategy
Applying Constrained-Random Verification to Microprocessors
SoC Design and Development
Practical Ways To Estimate, Implement, And Verify SoC Decoupling Capacitance
Delivering Simultaneous Silicon and Software
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Datasheets
Accelerating Tool and Methodology Adoption
Design Flow Deployment
Design Implementation Collaboration
Low Power Optimization and Verification
Predictable Silicon Sign-Off
FPGA-Based Prototyping
SoC Design and Verification
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Success Stories
Phonak: Synopsys Professional Services Helps Phonak Establish Rapid Prototyping Flow For Ultra Low Power Designs
Maxtek: Maxtek Leverages Synopsys' Services and ASIC Prototyping Solutions to Develop 12.5 GS/s Digital Receiver
Oticon: Delivering the Next Generation in Hearing Aid Technology
Tessera: Advanced Verification Flow Enables Rapid Generation of IP
Teradici: Combination of Tools, IP and Services Helps Launch StartUp
ITRI: Establishing a New Production Flow for Low Power SoCs
Tundra: Rapid Deployment of Complete, Production-Ready Flow
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White Papers
Power Hungry? Series - Advanced Dynamic Power Reduction Techniques
Managing Functional Verification Projects
Power Hungry? Strategies to Trim Your Chip's Appetite
Setting up a Versatile Flow & Environment to Improve Design Productivity
Improve SoC Design Productivity By Performing Quality Checks on
Measuring and Improving IC Design Productivity
A Practical Methodology for Calculating IR Drop Targets for Advanced Designs
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Technical Papers
Implementation Methodology for Dual-Mode GPS Receiver
Implementing Multi-VDD Designs with DCT and ICC
Power Gating Design Tradeoffs and Considerations In Production Low-Power Designs
Randomized Testbench Development, a Case Study in USB
Designing Advanced ASIC’s with Synopsys Design Tool Suite
Hold Me Please! How to Fix Post-Route Hold Violations Quickly and Easily Using Distributed Multi-Scenario Analysis
Advanced Low Power, Multi-Supply Implementation Techniques for 65nm and Beyond using DCT and ICC
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